This question was closed without grading. Reason: No acceptable answer
Aug 2, 2006 20:35
17 yrs ago
3 viewers *
Portuguese term
prova de retícula
Portuguese to English
Tech/Engineering
Computers (general)
Printers
"Impresso e pré-impresso personalizado
Prova contratual – Prova de retícula
Gerenciamento e simulação de cor
Assistência Técnica Canon em todo o Brasil"
Thanks!
Prova contratual – Prova de retícula
Gerenciamento e simulação de cor
Assistência Técnica Canon em todo o Brasil"
Thanks!
Proposed translations
(English)
5 | reticle test | airmailrpl |
4 | cross-hair test | Clauwolf |
Proposed translations
20 mins
cross-hair test
Declined
:) Pelo menos está "quente":
The CROSS-HAIR test pattern will be automatically displayed. ... STATIC mode will not automatically select the CROSS-HAIR test. pattern. ...
www.necvisualsystems.com/Documents/UserManuals/xg852_1352.p... -
Optometry and Vision Science - Fulltext: Volume 81(5) May 2004 p ...Polarized cross-hair test to assess binocularity. a. If subjects are found to be suppressing, the examination is terminated. 3. Monocular acuity measurement ...
www.optvissci.com/pt/re/ovs/fulltext.00006324-200405000-000... -
The CROSS-HAIR test pattern will be automatically displayed. ... STATIC mode will not automatically select the CROSS-HAIR test. pattern. ...
www.necvisualsystems.com/Documents/UserManuals/xg852_1352.p... -
Optometry and Vision Science - Fulltext: Volume 81(5) May 2004 p ...Polarized cross-hair test to assess binocularity. a. If subjects are found to be suppressing, the examination is terminated. 3. Monocular acuity measurement ...
www.optvissci.com/pt/re/ovs/fulltext.00006324-200405000-000... -
12 hrs
reticle test
Declined
Mask inspection process accounting for mask writer proximity ...
... printing said generic geometrical shapes on a reticle test mask ; measuring said printed generic geometrical shapes ; and collecting the provided ...
www.freshpatents.com/Mask-inspection-process-accounting-for...
Drop-in test structure and methodology for characterizing an ...
The actual reticle test patterns and test structures may cover a substantially larger area with correspondingly greater complexity. As depicted in FIG. ...
www.freepatentsonline.com/6452412.html
Method for adjusting a temperature in a resist process - Patent ...
providing a reticle test pattern including at least one pad structure having a first critical dimension and at least one antenna structure having a second ...
www.freepatentsonline.com/6806008.html
... printing said generic geometrical shapes on a reticle test mask ; measuring said printed generic geometrical shapes ; and collecting the provided ...
www.freshpatents.com/Mask-inspection-process-accounting-for...
Drop-in test structure and methodology for characterizing an ...
The actual reticle test patterns and test structures may cover a substantially larger area with correspondingly greater complexity. As depicted in FIG. ...
www.freepatentsonline.com/6452412.html
Method for adjusting a temperature in a resist process - Patent ...
providing a reticle test pattern including at least one pad structure having a first critical dimension and at least one antenna structure having a second ...
www.freepatentsonline.com/6806008.html
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